Abstract
Three-dimensional imaging of a solid sample is attractive for high-throughput and non-destructive characterization methods, and computed tomography (CT) is well developed and widely used for several analytical methods such as electron microscopy. X-ray computed tomography (XCT) can obtain three-dimensional structural data of a solid sample, in particular morphology and elemental information.
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Tada, M., Matsui, H. (2017). Computed Laminography XAFS. In: Iwasawa, Y., Asakura, K., Tada, M. (eds) XAFS Techniques for Catalysts, Nanomaterials, and Surfaces. Springer, Cham. https://doi.org/10.1007/978-3-319-43866-5_11
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DOI: https://doi.org/10.1007/978-3-319-43866-5_11
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