Test Generation for Detection of Malicious Parametric Variations

Abstract

Reusable hardware Intellectual Property (IP) based System-on-Chip (SoC) design has emerged as a pervasive design practice in the industry to dramatically reduce design/verification cost while meeting aggressive time-to-market constraints. It is crucial to ensure that an IP block is not vulnerable to input conditions that violate its non-functional (parametric) constraints, such as power, temperature, or performance. Power supply voltages, increased integration densities, and higher operating frequencies, among other factors, are producing devices that are more sensitive to power dissipation and reliability problems. Power viruses which have excessive power dissipation can lead to overheating, electromigration, and a reduced chip lifetime. Moreover, large instantaneous power consumption causes voltage drop and ground bounce, resulting in circuit delays and soft errors. As a result, reliability analysis of worst-case peak power and peak temperature has steadily become a critical part of the design process of digital circuits.