Abstract
Various textured structures have been incorporated into photovoltaic devices to improve the short-circuit current density based on optical confinement effects. Although intense light scattering occurs in textured structures , spectroscopic ellipsometry (SE) characterization can still be made even for textured single crystalline Si (c-Si) having a pyramid size of ~10 μm. Depending on the texture size, however, different measurements and analytical approaches need to be used. It has been demonstrated that high-precision SE characterization of submicron-size rough structures can be carried out by employing advanced optical models, including (i) effective-medium-approximation multilayer model and (ii) surface area model. From such SE analyses, structural non-uniformities in large-area solar cell modules can further be determined. In this chapter, we review SE characterization performed for textured structures in c-Si heterojunction, Si thin-film and Cu(In,Ga)Se2 solar cells.
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Fujiwara, H., Sago, Y. (2018). Characterization of Textured Structures. In: Fujiwara, H., Collins, R. (eds) Spectroscopic Ellipsometry for Photovoltaics. Springer Series in Optical Sciences, vol 214. Springer, Cham. https://doi.org/10.1007/978-3-319-95138-6_4
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