Abstract
A major and often unrecognized error source in digital image correlation (DIC) is the influence of the intervening air between the cameras and sample. Minute differences in air temperature, composition, or both can cause index of refraction changes that act as a lens and cause distortions in the DIC displacement and strain results (Jones and Reu, Exp Mech, 2017). There are limited options to correct this problem as it is both spatial and temporal in nature. One method is to use X-rays for imaging that are not affected by air refraction, but this requires costly equipment. A second method uses a vacuum chamber to minimize the intervening air to remove the distortions, but unfortunately this requires inconvenient setups.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Reference
Jones, E., Reu. P.: Distortion of Digital Image Correlation (DIC) Displacements and strains from heat waves. Experimental Mechanics: 1–24 (2017)
Acknowledgements
We would like to thank Rusty Spillers, Seth Spitzer and Paul Farias for help in setting up and conducting these experiments.
Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA-0003525.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2019 The Society for Experimental Mechanics, Inc.
About this paper
Cite this paper
Reu, P.L., Jones, E.M.C. (2019). Eliminating Air Refraction Issues in DIC by Conducting Experiments in Vacuum. In: Lamberti, L., Lin, MT., Furlong, C., Sciammarella, C., Reu, P., Sutton, M. (eds) Advancement of Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 3. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-97481-1_11
Download citation
DOI: https://doi.org/10.1007/978-3-319-97481-1_11
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-97480-4
Online ISBN: 978-3-319-97481-1
eBook Packages: EngineeringEngineering (R0)