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Progress in Scanning Transmission Electron Microscopy at the University of Chicago

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Unconventional Electron Microscopy for Molecular Structure Determination

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Abstract

The purpose of this article is to inform the reader, in general terms, of the progress in scanning transmission electron microscopy at our institution. It is not our intent that this be a critically technical paper but, rather, one in which we summarize some of the developments in electron microscopy at the University of Chicago over the past few years. For more detailed discussion, the interested reader can refer to the cited literature.

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Author information

Author notes

  1. M. S. Isaacson (Alfred P. Sloan Foundation Fellow)

    Present address: School of Applied and Engineering Physics, Cornell University, 14853, Ithaca, New York, USA

  2. E. Zeitler

    Present address: Institut für Elektronenmikroskopie, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D 1000, Berlin 33, Germany

Authors and Affiliations

  1. Department of Physics and the Enrico Fermi Institute, The University of Chicago, 60637, Chicago, Illinois, USA

    A. V. Crewe, M. S. Isaacson (Alfred P. Sloan Foundation Fellow) & E. Zeitler

  2. Department of Biophyscis, The University of Chicago, 60637, Chicago, Illinois, USA

    A. V. Crewe

Authors
  1. A. V. Crewe
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  2. M. S. Isaacson
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  3. E. Zeitler
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Editor information

W. Hoppe R. Mason

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© 1979 Friedr. Vieweg & Sohn Verlagsgesellschaft mbH, Braunschweig

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Crewe, A.V., Isaacson, M.S., Zeitler, E. (1979). Progress in Scanning Transmission Electron Microscopy at the University of Chicago. In: Hoppe, W., Mason, R. (eds) Unconventional Electron Microscopy for Molecular Structure Determination. Advances in Structure Research by Diffraction Methods / Fortschritte der Strukturforschung mit Beugungsmethoden. Vieweg+Teubner Verlag, Wiesbaden. https://doi.org/10.1007/978-3-322-86362-1_2

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  • DOI: https://doi.org/10.1007/978-3-322-86362-1_2

  • Publisher Name: Vieweg+Teubner Verlag, Wiesbaden

  • Print ISBN: 978-3-528-08117-1

  • Online ISBN: 978-3-322-86362-1

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