Abstract
This paper presents a new pseudo-exhaustive testing algorithm that is composed of the path sensitization and sub-circuit partitioning using t-distribution. In the proposed testing algorithm, the paths, for the path sensitization the, between PIs and POs based on the high TMY(test-mainstay) nodes of CUT(circuit under test) are sensitized and the boundary nodes, for the partitioned sub-circuits, are defined on the level of significance α on t-distribution respectively. As a consequence, when (1-α) is 0.2368, the most suitable of the performance to operate the singular cover and consistency operation in the path sensitization. And when α is 0.5217, the most suitable of the performance to partition the sub-circuit in sub-circuit partitioning.
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Noh, J.S., Park, C.G., Rhee, KH. (2005). Path Sensitization and Sub-circuit Partition of CUT Using t-Distribution for Pseudo-exhaustive Testing. In: Baik, DK. (eds) Systems Modeling and Simulation: Theory and Applications. AsiaSim 2004. Lecture Notes in Computer Science(), vol 3398. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30585-9_23
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DOI: https://doi.org/10.1007/978-3-540-30585-9_23
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