Abstract
This chapter reviews a selection of dielectric function models progressed for lineshape analysis of (far) infrared ellipsometry data. Contributions to the dielectric function due to polar lattice vibrations (phonons), impurity (lowpolarity) vibration modes, and free-charge-carrier plasma excitations are discussed. A condensed derivation for the classical anisotropic magneto-optic free-charge-carrier contribution is given.
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Schubert, M. Infrared Model Dielectric Functions. In: Infrared Ellipsometry on Semiconductor Layer Structures. Springer Tracts in Modern Physics, vol 209. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44701-6_3
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DOI: https://doi.org/10.1007/978-3-540-44701-6_3
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Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-23249-0
Online ISBN: 978-3-540-44701-6
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