Abstract
Two experimental applications of an atomic force microscope (AFM) are considered: dynamic force spectroscopy and atomic friction. The former is aimed at determination of bond properties of biological complexes by means of subjecting them to a steadily increasing pulling force until the bonds break. On the other hand, in atomic friction experiments, one investigates the friction forces acting on the AFM tip brought into contact with the surface and pulled with respect to it; usually, the tip’s motion proceeds via abrupt jumps from one lattice site of the surface to the next. Both forced rupture of chemical bonds and interstitial jumps are thermally activated events and are described within the same mathematical framework offered by Kramers’ rate theory. Characterization of the force-dependent rate of bond rupture/interstitial jumps provides one with a valuable insight into the relevant energy scales of the system studied. The standard approach to data analysis is based on the single-step rate equation, from which the logarithmic relation between the pulling velocity and the most probable force of bond rupture/interstitial jump follows. An alternative method of analyzing the experimental data is discussed, which allows one to test the applicability of the single-step rate equation in a given experimental system, and to accurately deduce the transition rate from the experimental data. Application of this method to both dynamic force spectroscopy and atomic friction experiments indicated that, generically, the single-step rate equation cannot explain the experimentally observed statistics of rupture/jump events. In the former case, the discrepancy between theory and experiments is explained quantitatively in terms of heterogeneity of chemical bonds involved, while in the latter case, the discrepancy is attributed to the ageing of the contact between the AFM tip and the surface.
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Evstigneev, M. (2009). Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction. In: Applied Scanning Probe Methods XI. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85037-3_8
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DOI: https://doi.org/10.1007/978-3-540-85037-3_8
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