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Method for Precise Force Measurements

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Noncontact Atomic Force Microscopy

Part of the book series: NanoScience and Technology ((NANO))

Abstract

Quantitative force analysis using noncontact atomic force microscopy (NC-AFM) requires strict experimental conditions. Tip–sample positioning is an especially critical issue and thermal drift is a significant disturbance effecting precise force measurements. This chapter concentrates on techniques of tip–sample positioning at the atomic level for force measurements. Methods for compensating the thermal drift enable measurements of force spectroscopy and force mapping even at room temperature, for which precise force measurement had previously been thought impossible. The methods are also useful at low temperatures

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Author information

Authors and Affiliations

  1. Graduate School of Engineering, Osaka University, 2-1, Yamada-Oka, Suita, Osaka, 565-0871, Japan

    Masayuki Abe & Ken-ichi Morita

Authors
  1. Masayuki Abe
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  2. Ken-ichi Morita
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Corresponding author

Correspondence to Masayuki Abe .

Editor information

Editors and Affiliations

  1. Graduate School of Engineering, Dept. of Electrical, Electronic and, Osaka University, Yamada-Oka 2-1, Suita, 565-0871, Japan

    Seizo Morita

  2. Institut für Experimentelle und, Angewandte Physik, Universität Regensburg, Universitätsstr. 31, Regensburg, 93053, Germany

    Franz J. Giessibl

  3. FB Physik, Inst. Angewandte Physik, Universität Hamburg, Jungiusstr. 11, Hamburg, 20355, Germany

    Roland Wiesendanger

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Abe, M., Morita, Ki. (2009). Method for Precise Force Measurements. In: Morita, S., Giessibl, F., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-01495-6_2

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