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Josephson Effect in SFNS Josephson Junctions

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Fundamentals of Superconducting Nanoelectronics

Part of the book series: NanoScience and Technology ((NANO))

Abstract

The critical current, I C, of Josephson junctions both in ramp-type (S-FN-S) and in overlap (SNF-FN-FNS, SN-FN-NS, SNF-N-FNS) geometries has been calculated in the frame of linearized Usadel equations (S–superconductor, F–ferromagnetic, N–normal metal). For the ramp-type structures, in which S electrodes contact directly the end walls of FN bilayer, it is shown that I C may exhibit damping oscillations as a function of both the distance L between superconductors and thicknesses d F,N of ferromagnetic and normal layers. The conditions have been determined under which the decay length and period of oscillation of I C(L) at fixed d F are of the order of decay length of superconducting correlations in the N metal, ξN, that is much larger than in F film. In overlap configurations, in which S films are placed on the top of NF bilayer, the studied junctions have complex SNF or SN electrodes (N or NF bilayer are situated under a superconductor). We demonstrate that in these geometries the critical current can exceed that in ramp-type junctions. Based on these results, the choice of the most practically applicable geometry is discussed.

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Acknowledgements

This work was supported by RFBR grant 09-02-12176-ofi_m and partially supported by Moldavian State Program grant 11.836.05.01A.

Author information

Authors and Affiliations

  1. Nuclear Physics Institute, Moscow State University, 119992, Moscow, Russia

    T. Yu. Karminskaya & M. Yu. Kupriyanov

  2. Faculty of Science and Technology and MESA+Institute of Nanotechnology, University of Twente, 7500 AE, Enschede, The Netherlands

    A. A. Golubov

  3. Institute of Nanotechnology, Karlsruhe Institute of Technology, D-76021, Karlsruhe, Germany

    A. S. Sidorenko

  4. Institute of Electronic Engineering and Nanotechnologies Chisinau, Chisinau, Moldova

    A. S. Sidorenko

Authors
  1. T. Yu. Karminskaya
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  2. M. Yu. Kupriyanov
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  3. A. A. Golubov
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  4. A. S. Sidorenko
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Corresponding author

Correspondence to M. Yu. Kupriyanov .

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Editors and Affiliations

  1. Inst. Electronic Engineering &, Industrial Technologies, Academy of Science of Moldova, Academiei Street 3/3, Chisinau, 2028, Moldova

    Anatolie Sidorenko

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Karminskaya, T.Y., Kupriyanov, M.Y., Golubov, A.A., Sidorenko, A.S. (2011). Josephson Effect in SFNS Josephson Junctions. In: Sidorenko, A. (eds) Fundamentals of Superconducting Nanoelectronics. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20158-5_7

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