Abstract
This chapter describes the principles of optical modulation spectroscopy. Special attention is focused on photo- and contactless electro-reflectance techniques, which are nondestructive for samples, and are widely applied to study the band structure of various semiconductor materials and low-dimensional heterostructures. For these methods, experimental setups are described and theoretical approaches to analyze the experimental data are discussed. In addition, examples of the application of photo- and contactless electro-reflectance spectroscopies to study optical transitions in III–V(-N) bulk-like epilayers, quantum wells, quantum dots, and device structures are presented.
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Acknowledgements
The authors acknowledge many colleagues (Alfred Forchel from Wurzburg University, James Harris from Stanford University, Klaus Ploog from Paul-Drude-Institut für Festkörperelektronik, Czeslaw Skierbiszewski from UNIPRESS, Robert Dwilinski from AMMONO company, Mariusz Rudzinski from ITME, and their coworkers) for delivering samples for PR and CER studies as well as the COST Action MP0805 and the MNiSW grant related to this action for financial support.
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Kudrawiec, R., Misiewicz, J. (2012). Optical Modulation Spectroscopy. In: Patane, A., Balkan, N. (eds) Semiconductor Research. Springer Series in Materials Science, vol 150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23351-7_4
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