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Atomic Force Acoustic Microscopy

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Acoustic Scanning Probe Microscopy

Part of the book series: NanoScience and Technology ((NANO))

Abstract

This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), the basic theoretical models, the experimental techniques to obtain quantitative values of local elastic constants, and non-linear AFAM. Analytical and finite element models describing transverse flexural vibrations of AFM cantilevers with and without tip-surface contact are recapitulated. The models are suitable for micro fabricated silicon cantilevers of approximately rectangular cross section which are typically used in AFAM. Experimental methods to obtain single-point as well as array measurements and full spectroscopy images are discussed in combination with the respective reference methods for calibration. In a non-linear AFAM experiment, the vibration amplitudes of the sample surface and the cantilever are measured quantitatively with an interferometer at different excitation amplitudes, and the full tip-sample interaction force curve is reconstructed using a frequency dependent transfer function.

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Author information

Authors and Affiliations

  1. Fraunhofer Institute for Non-Destructive Testing (IZFP), Campus E3.1, 66123 , Saarbrücken, Germany

    U. Rabe & S. Hirsekorn

  2. Fraunhofer Institute for Non-Destructive Testing (IZFP), Maria-Reiche-Strasse 2, 01069 , Dresden, Germany

    M. Kopycinska-Müller

Authors
  1. U. Rabe
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  2. M. Kopycinska-Müller
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  3. S. Hirsekorn
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Corresponding author

Correspondence to U. Rabe .

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Editors and Affiliations

  1. , Department of Land, Environment,, University of Padova, Viale dell'Università 16, Legnaro, 35020, Padova, Italy

    Francesco Marinello

  2. "La Sapienza", Department of Energetics, University of Rome, Via A. Scarpa 16, Rome, 00161, Italy

    Daniele Passeri

  3. , Dip.di Innovazione Meccanica e, University of Padova, Via Venezia 1, Padove, 35131, Italy

    Enrico Savio

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Rabe, U., Kopycinska-Müller, M., Hirsekorn, S. (2013). Atomic Force Acoustic Microscopy. In: Marinello, F., Passeri, D., Savio, E. (eds) Acoustic Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27494-7_5

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