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Terahertz Scattering

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Terahertz Spectroscopy and Imaging

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 171))

Abstract

Terahertz (THz) Time Domain Spectroscopy (TDS) measurements have the unique ability to detect both the amplitude and phase of the electric field, simultaneously. This eliminates complications introduced by Kramers–Kronig relations typically used in near-infrared spectroscopy. Many materials of interest contain resonant features in their refractive indices in the far-infrared (THz) spectrum, while their packaging materials are generally transparent. Thus, an important application for THz TDS is the ability to see inside packaging materials and detect the material features of their contents. Such applications are promising for security screening (concealed drugs, explosives, etc.) in post offices and airports as well as for non-destructive evaluation (NDE) of products on an assembly line or tissue damage due to burns or cancer [1–6].

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Authors and Affiliations

  1. Electrical and Computer Engineering Department, Portland State University, Portland, OR, USA

    L. M. Zurk & S. Schecklman

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  1. L. M. Zurk
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  2. S. Schecklman
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Correspondence to L. M. Zurk .

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Editors and Affiliations

  1. , Department of Physics and Mathematics, University of Eastern Finland, Yliopistokatu Street 7, Joensuu, 80100, Finland

    Kai-Erik Peiponen

  2. , Department of Chemical Engineering and, University of Cambridge, Pembroke Street, Cambridge, CB2 3RA, United Kingdom

    Axel Zeitler

  3. , School of Engineering, The University of Tokyo, Hongo, Bunkyo-ku 7-3-1, Tokyo, 113-8656, Japan

    Makoto Kuwata-Gonokami

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Zurk, L.M., Schecklman, S. (2012). Terahertz Scattering. In: Peiponen, KE., Zeitler, A., Kuwata-Gonokami, M. (eds) Terahertz Spectroscopy and Imaging. Springer Series in Optical Sciences, vol 171. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-29564-5_5

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  • DOI: https://doi.org/10.1007/978-3-642-29564-5_5

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  • Online ISBN: 978-3-642-29564-5

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