Abstract
Nowadays the X-rays are widely used for non-destructive quantitative and qualitative characterization of the materials used in modern electronics, optics, semiconductor industry, lasers, sensors, and many other applications on micro- and nano-level.
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References
M.L. Goldberger, K.M. Watson, Collision Theory (John Wiley, New York, 1964)
R.W. James, The Optical Principle of the Diffraction of X-rays (G.Bell and Sons, London, 1962)
A. Authier, Dynamical Theory of X-ray Diffraction (Oxford University Press, New York, 2001)
U. Pietsch, V. Holy, T. Baumbach, High-Resolution X-ray Scattering: From Thin Films to Lateral Nanostuctures, 2nd edn. (Springer, Berlin, 2004)
L.D. Landau, E.M. Lifshitz, Electrodynamics of Condensed Matter, 2nd edn. (Nauka, Moscow, 1982) (in Russian)
B.W. Batterman, Rev. Mod. Phys. 36, 681 (1964)
L.D. Landau, E.M. Lifshitz, Quantum Mechanics, 3rd edn. (Pergamon Press, Oxford, 1977)
M. Born, E. Wolf, Principles of Optics, 7th edn. (Cambridge University Press, Cambridge, 1999)
A.A. Malyutin, Quantum Electron. 34, 960 (2004)
P. Cloetens, R. Barrett, J. Baruchel, J.-P. Guigay, M. Schlenker, J. Phys. D: Appl. Phys. 29, 133 (1996)
K.J. Gaffney, H.N. Chapman, Science 316, 1444 (2007)
S.-K. Son, L. Young, R. Santra, Phys. Rev. A 83, 033402 (2011)
I.A. Vartanyants et al., Phys. Rev. Lett. 107, 144801 (2011)
I.D. Feranchuk, O.D. Skoromnik, Phys. Rev. A 82, 052803 (2010)
V. Pecharsky, P. Zavalij, Fundamentals of Powder Diffraction and Structural Characterization of Materials, 2nd edn. (Springer, Berlin, 2008)
M. Rossmann, E. Arnold, in Crystallography of Biological Molecules. International Tables for Crystallography, vol. F (Kluwer Academic Publishers, Dordrecht, 2001)
I.C. Noyan, J.B. Cohen, Resudial Stress: Measurements by Diffraction and Iterpretation (Springer, New York, 1987)
H.-J. Bunge, Texture Analysis in Materials Science (Butterworth, London, 1983)
L.A. Feigin, D.I. Svergun, Structure Analysis by Small-Angle X-Ray and Neutron Scattering ( Plenum Press, New York, 1987)
T. Egami, S.J.L. Billinge, Underneath the Bragg Peaks: Structural Analysis of Complex Materials (Pergamon Press Elsevier, Oxford, 2003)
P.M. Morse, H. Feshbach, Methods of Theoretical Physics (McGraw-Hill, New York, 1953)
A.I. Akhiezer, V.B. Berestetsky, Quantum Electrodynamics (Nauka, Moscow, 1969)
S.K. Sinha, E.B. Sirota, S. Garoff, H.B. Stanley, Phys. Rev. B 38, 2297 (1988)
G. Renaud, R. Lazzari, F. Leroy, Surf. Sci. Rep. 64, 255 (2009)
M.A. Krivoglaz, X-Ray and Neutron Diffraction in Nonideal Crystals (Springer, Berlin, 1996)
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Benediktovitch, A., Feranchuk, I., Ulyanenkov, A. (2014). The Theory of X-Ray Scattering from Macroscopical Objects. In: Theoretical Concepts of X-Ray Nanoscale Analysis. Springer Series in Materials Science, vol 183. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38177-5_2
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DOI: https://doi.org/10.1007/978-3-642-38177-5_2
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