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Experimental Study of the L3, L2 and L1 White Line Intensities in Rare-Earth Compounds

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EXAFS and Near Edge Structure III

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 2))

Abstract

This investigation was motivated by a recent observation that the intensity of the white lines at the L3 and L2 absorption edges of Nd3+ is markedly increased in going from pure NdF3 crystal, which is highly ionic in character, to a NdF3-doped BeF2 glass [1]. The normal electronic configuration of the rare-earth (RE) ions in the trivalent state may be written as (Xe) 4fn, with n = 0, 1,...14 for La3+, Ce3+... Lu3+ respectively.

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References

  1. K.J. Rao, J. Wong and M.J. Weber: J. Chem. Phys. 28, 6228 (1983)

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  2. E.A. Stern and K. Kim: Phys. Rev. B23, 3781 (1981)

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  3. J. Wong, F.W. Lytle, R.P. Messmer and D.H. Maylotte: Phys. Rev. B (1984) in press.

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© 1984 Springer-Verlag Berlin Heidelberg

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Wong, J., Lamson, S.H., Rao, K.J. (1984). Experimental Study of the L3, L2 and L1 White Line Intensities in Rare-Earth Compounds. In: Hodgson, K.O., Hedman, B., Penner-Hahn, J.E. (eds) EXAFS and Near Edge Structure III. Springer Proceedings in Physics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-46522-2_13

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  • DOI: https://doi.org/10.1007/978-3-642-46522-2_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-46524-6

  • Online ISBN: 978-3-642-46522-2

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