Abstract
Picosecond optoelectronics provides the capability to measure the frequency response of solid state devices with much greater bandwidth than conventional techniques. Laser-triggered switches acted as pulse generators and samplers to measure the impulse response of a device with a temporal resolution of a few picoseconds. Fourier analysis of the impulse response functions yields scattering matrix parameters with a frequency bandwidth of 40 GHz or more. In comparison, current frequency-domain technology is limited to a 26 GHz bandwidth. (Higher frequencies can be covered with frequency mixing techniques, at the cost of additional noise and experimental complexity.)
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REFERENCES
Donald E. Cooper, “Picosecond Optoelectronic Measurement of Microstrip Dispersion,” to be published in Appl. Phys. Lett.
P. R. Smith, D. H. Auston, A. M. Johnson, and W. M. Augustyniak, Appl. Phys. Lett. 38, p. 47 (1981).
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© 1985 Springer-Verlag Berlin Heidelberg
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Cooper, D.E., Moss, S.C. (1985). Picosecond Optoelectronic Diagnostics of Field Effect Transistors. In: Mourou, G.A., Bloom, D.M., Lee, CH. (eds) Picosecond Electronics and Optoelectronics. Springer Series in Electrophysics, vol 21. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-70780-3_11
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DOI: https://doi.org/10.1007/978-3-642-70780-3_11
Publisher Name: Springer, Berlin, Heidelberg
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