Abstract
Structures of reconstructed surfaces and adsorbed layers are studied in-situ by UHV electron microscopy and diffraction. Transmission electron diffraction is useful for determining long range ordered structures such as Si(111)7×7 and also short range ordered structures using kinematical approximation. High-resolution electron microscopy at UHV can reveal local structures at atomic level resolution in transmission mode and at sub-nm resolution in reflection mode. Observations of the phase transition of Si(111) −7×7 to 1×1 and adsorption processes give finer information on structural details.
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Takayanagi, K. (1988). Surface Structure Study by High-Resolution Electron Microscopy and Diffraction. In: de Wette, F.W. (eds) Solvay Conference on Surface Science. Springer Series in Surface Sciences, vol 14. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-74218-7_5
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DOI: https://doi.org/10.1007/978-3-642-74218-7_5
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