Abstract
Reflection Electron Microscopy (REM) is applied to the imaging of stacking faults immediately beneath the surface of bulk crystals. Strong contrast is obtained on stacking fault ribbons in graphite. The contrast on Pt(lll) surfaces is also attributed to the stacking sequence change of the topmost layer of atoms.
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Hsu, T., Cowley, J.M. (1985). Reflection Electron Microscopy Studies of Crystal Lattice Termination at Surfaces. In: Van Hove, M.A., Tong, S.Y. (eds) The Structure of Surfaces. Springer Series in Surface Sciences, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82493-7_10
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DOI: https://doi.org/10.1007/978-3-642-82493-7_10
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