Abstract
A new method of crystallite size determination has been applied to submicrocrystalline materials prepared by high-pressure torsion deformation. The method is based on the measurement of the small-angle diffuse scattering in the transmitted wave and requires thin foil samples and well-defined incoming plane wave. The physical information is encoded in the wave modification due to primary extinction in the crystallites.
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Kužel, R., Holý, V., Čerňanský, M., Kubéna, J., Šimek, D., Kub, J. (2004). Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave. In: Mittemeijer, E.J., Scardi, P. (eds) Diffraction Analysis of the Microstructure of Materials. Springer Series in Materials Science, vol 68. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-06723-9_9
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DOI: https://doi.org/10.1007/978-3-662-06723-9_9
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