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Challenges in the Analysis of the Local Piezoelectric Response

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Nanoscale Characterisation of Ferroelectric Materials

Part of the book series: NanoScience and Technology ((NANO))

Abstract

The piezoresponse technique is based on the detection of local vibrations of a cantilever induced by a probing AC signal applied between the conductive tip of a scanning force microscope (SFM) and the bottom electrode of a ferroelectric sample. The cantilever vibrations are converted into an electrical signal by the position sensitive detector of the SFM and extracted from the global deflection signal using a standard lock-in technique. This electrical signal representing the cantilever vibrations is further referred to as the piezoresponse signal (PRS), for reasons that will be explained later.

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Authors
  1. C. Harnagea
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  2. A. Pignolet
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Editor information

Editors and Affiliations

  1. Max Planck Institute of Microstructure Physics, Weinberg 2, 06120, Halle (Saale), Germany

    Marin Alexe

  2. Department of Materials Science and Engineering, North Carolina State University, Campus Box 7920, 27695, Raleigh, NC, USA

    Alexei Gruverman

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© 2004 Springer-Verlag Berlin Heidelberg

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Harnagea, C., Pignolet, A. (2004). Challenges in the Analysis of the Local Piezoelectric Response. In: Alexe, M., Gruverman, A. (eds) Nanoscale Characterisation of Ferroelectric Materials. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-08901-9_2

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  • DOI: https://doi.org/10.1007/978-3-662-08901-9_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-05844-8

  • Online ISBN: 978-3-662-08901-9

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