Technique for Orientation Determinations by Means of Kossel Diffraction in the Electron Microprobe

Abstract

A transmission Kossel camera for the AMX microprobe is described, which provides facilities for investigating any selected region of the specimen.

A technique for the determination of orientations from Kossel patterns is briefly summarized, and the application of the method is illustrated by means of an example. In combination with a computer programme the method provides a rapid means of orientation determination and is particularly useful in investigations where large numbers of orientations must be determined (e.g. preferred orientation studies).