Abstract
Photoelectron yield spectroscopy (PYS), in which total photoelectron yield is recorded as a function of incident photon energy, has been widely applied to determine the ionization energy of various organic electronic materials. PYS has some advantage complimentary to conventional photoelectron spectroscopy; (i) measurement environment is not limited to vacuum, (ii) sample charge-up problem is practically negligible, (iii) high sensitivity is available in vacuum, and so on. Thus, PYS is a powerful method to explore the electronic structures of organic materials and interfaces in practical situation. In this chapter, first we describe the basic principle and experimental setup of PYS. Then the applications to various organic materials and interfaces are described with the results of combined application of PYS and high sensitivity photoemission spectroscopy.
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Acknowledgments
This work was supported by the Global-COE program at Chiba University (Advanced School for Organic Electronics, G-03, MEXT), KAKENHI (Grants No. 21245042, 22750167, 25288114), and the Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST).
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Ishii, H., Kinjo, H., Sato, T., Machida, Si., Nakayama, Y. (2015). Photoelectron Yield Spectroscopy for Organic Materials and Interfaces. In: Ishii, H., Kudo, K., Nakayama, T., Ueno, N. (eds) Electronic Processes in Organic Electronics. Springer Series in Materials Science, vol 209. Springer, Tokyo. https://doi.org/10.1007/978-4-431-55206-2_8
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