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Peripheral Instruments and Techniques for High-Resolution Electron Microscopy

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High-Resolution Electron Microscopy for Materials Science

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Abstract

In order to extract structure information from high-resolution images, various image processing techniques have been used. For example, noise on a high-resolution image of a crystal can be removed by over-printing with translating the image in a dark room. With an optical bench consisting of a laser beam and optical lenses, optical diffractograms of electron microscope images have been obtained, and by inserting a phase filter and a mask, image reconstruction has been carried out by modulating the phases and the ampHtudes of the scattered beams.

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Authors and Affiliations

  1. Institute for Advanced Materials Processing, Tohoku University, 2-1-1 Katahira, 980-8577, Aoba-ku, Sendai, Miyagi, Japan

    Daisuke Shindo (Dr., Professor)

  2. Institute for Materials Research, Tohoku University, 2-1-1 Katahira, 980-8577, Aoba-ku, Sendai, Miyagi, Japan

    Kenji Hiraga (Dr., Professor)

Authors
  1. Daisuke Shindo
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  2. Kenji Hiraga
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© 1998 Springer-Verlag Tokyo

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Shindo, D., Hiraga, K. (1998). Peripheral Instruments and Techniques for High-Resolution Electron Microscopy. In: High-Resolution Electron Microscopy for Materials Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-68422-0_4

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  • DOI: https://doi.org/10.1007/978-4-431-68422-0_4

  • Publisher Name: Springer, Tokyo

  • Print ISBN: 978-4-431-70234-4

  • Online ISBN: 978-4-431-68422-0

  • eBook Packages: Springer Book Archive

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