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Self-Assembly of Nanostructured Semiconductor Films

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Fine Particles Science and Technology

Part of the book series: NATO ASI Series ((ASHT,volume 12))

Abstract

Spectroscopic (absorption and emission), microscopic (transmission electron and atomic force), electrochemical (cyclic voltammetry) and photoelectrochemical (photocurrent) measurements have provided evidence for the formation of stable ultrathin films with regular periodicities, by the layer-by-layer self-assembly of polycations, montmorillonite platelets, and cadmium sulfide, lead sulfide, and titanium dioxide nanoparticles.

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© 1996 Kluwer Academic Publishers

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Fendler, J.H., Kotov, N.A., Dékány, I. (1996). Self-Assembly of Nanostructured Semiconductor Films. In: Pelizzetti, E. (eds) Fine Particles Science and Technology. NATO ASI Series, vol 12. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0259-6_39

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  • DOI: https://doi.org/10.1007/978-94-009-0259-6_39

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-4047-8

  • Online ISBN: 978-94-009-0259-6

  • eBook Packages: Springer Book Archive

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