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Individual Molecules on GaAs(001)-(2×4) and Si(001)-(2×1): Images, Statistics, and Modelling

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Ultimate Limits of Fabrication and Measurement

Part of the book series: NATO ASI Series ((NSSE,volume 292))

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Abstract

This paper brings together the results of three distinct activities in the study of individual molecules on semiconductor surfaces:

  1. 1.

    An experimental study by UHV STM in which molecules can be imaged one at a time on the surface of interest;

  2. 2.

    A statistical analysis of the STM images to determine the effect of the occupation of neighbouring sites on the probability of adsorption;

  3. 3.

    Ab initio theoretical modelling of the geometrical and electronic structure of adsorbed molecules.

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Author information

Authors and Affiliations

  1. Department of Materials, Oxford University, Oxford, OX1 3PH, UK

    C. M. Goringe, A. J. Mayne, M. O. Schweitzer & G. A. D. Briggs

  2. Semiconductor IRC and Department of Chemistry, Imperial College, London, SW7 2AY, UK

    A. R. Avery & T. S. Jones

  3. Inorganic Chemistry Laboratory, Oxford University, Oxford, OX1 3QR, UK

    A. J. Mayne

  4. QUEST and Department of Chemical and Nuclear Engineering, University of California, Santa Barbara, CA, 93106, USA

    W. Widdra & W. H. Weinberg

  5. Clarendon Laboratory, Oxford University, Oxford, OX1 3PU, UK

    A. J. Fisher

  6. Department of Physics, Durham University, Durham, DH1 3LE, UK

    A. J. Fisher

  7. Department of Physics and Astronomy, University of Maine, ME, 04469, USA

    C. W. Smith

Authors
  1. C. M. Goringe
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  2. A. R. Avery
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  3. A. J. Mayne
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  4. M. O. Schweitzer
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  5. W. Widdra
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  6. A. J. Fisher
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  7. T. S. Jones
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  8. G. A. D. Briggs
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  9. W. H. Weinberg
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  10. C. W. Smith
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Editor information

Editors and Affiliations

  1. Department of Engineering, The University of Cambridge, Cambridge, UK

    M. E. Welland

  2. IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland

    J. K. Gimzewski

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© 1995 Springer Science+Business Media Dordrecht

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Goringe, C.M. et al. (1995). Individual Molecules on GaAs(001)-(2×4) and Si(001)-(2×1): Images, Statistics, and Modelling. In: Welland, M.E., Gimzewski, J.K. (eds) Ultimate Limits of Fabrication and Measurement. NATO ASI Series, vol 292. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0041-0_27

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  • DOI: https://doi.org/10.1007/978-94-011-0041-0_27

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4023-5

  • Online ISBN: 978-94-011-0041-0

  • eBook Packages: Springer Book Archive

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