Abstract
We have developed an optical non-contact scanner able to measure the detector surface profile of both single chip and mosaic CCD cameras. A precision of 1 μm in vertical displacement has been demonstrated when measuring 30 mm square CCDs. We have achieved similar performance when scanning mosaics with dimensions of up to 65 mm square. The system relies on using the CCD under test to measure the position of a pin-hole image projected onto its surface and so will only work with active operational mosaics that are capable of producing good quality images.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1998 Springer Science+Business Media Dordrecht
About this paper
Cite this paper
Tulloch, S., King, D. (1998). A Technique for the Determination of Co-Planarity in Mosaic CCD Cameras. In: Beletic, J.W., Amico, P. (eds) Optical Detectors for Astronomy. Astrophysics and Space Science Library, vol 228. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5262-4_44
Download citation
DOI: https://doi.org/10.1007/978-94-011-5262-4_44
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-6214-5
Online ISBN: 978-94-011-5262-4
eBook Packages: Springer Book Archive