Skip to main content
SpringerLink
Log in

Spin-Polarized Scanning Electron Microscopy

  • Chapter
  • First Online:
Compendium of Surface and Interface Analysis

  • 365 Accesses

Abstract

Spin-polarized scanning electron microscopy (spin SEM) is a method to visualize magnetization distribution at the surface of a ferromagnetic sample [1–4], whose principle is summarized in Fig. 102.1.

Principle of spin SEM

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution

Institutional subscriptions

References

  1. Koike, K., Hayakawa, K.: Scanning electron microscope observation of magnetic domains using spin-polarized secondary electrons. Jpn. J. Appl. Phys. 23, L187–L188 (1984)

    Article  Google Scholar 

  2. Unguris, J., Hembree, G.G., Celotta, R.J., Pierce, D.T.: High resolution magnetic microstructure imaging using secondary electron spin polarization analysis in a scanning electron microscope. J. Microsc. 139, RP1–RP2 (1985)

    Article  CAS  Google Scholar 

  3. Oepen, H.P., Kirschner, J.: Imaging of magnetic microstructures at surfaces: the scanning electron microscope with spin polarization analysis. Scan. Microsc. 5, 1–16 (1991)

    CAS  Google Scholar 

  4. Allenspach, R.: Ultrathin films: magnetism on the microscopic scale. J. Magn. Magn. Mater. 129, 160–185 (1994)

    Article  CAS  Google Scholar 

  5. Mott, N.F.: The scattering of fast electrons by atomic nuclei. Proc. R. Soc. London Ser. A 124, 425–442 (1929)

    Article  CAS  Google Scholar 

  6. Koike, K.: Spin-polarized scanning electron microscopy. Microscopy 62, 177–191 (2013)

    Article  Google Scholar 

  7. Kohashi, T., Konoto, M., Koike, K.: High-resolution spin-polarized scanning electron microscopy (spin SEM). J. Electron Microsc. 59, 43–52 (2010)

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Nano-Process Research Department, Center for Technology Innovation, Research & Development Group, Hitachi, Ltd., Tokyo, Japan

    Teruo Kohashi

Authors
  1. Teruo Kohashi
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Teruo Kohashi .

Editor information

Editors and Affiliations

  1. Tokyo, Japan

    The Surface Science Society of Japan

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer Nature Singapore Pte Ltd.

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Kohashi, T. (2018). Spin-Polarized Scanning Electron Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_102

Download citation

Publish with us

Policies and ethics

Search

Navigation