Abstract
Atomic force microscopy (AFM) can image the surfaces of flat materials, irrespective of their conductivity. The sample is usually imaged in air, but can be in liquid environments and under vacuum, as described in other chapters (Chaps. 6, and 55). AFM has also been applied to the electrode/electrolyte interfaces, since its invention.
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References
Gewirth, A.A., Niece, B.K.: Electrochemical applications of in situ scanning probe microscopy. Chem. Rev. 97, 1129–1162 (1997)
Masuda, T., Ikeda, K., Uosaki, K.: Potential-dependent adsorption/desorption behavior of perfluorosulfonated ionomer on a gold electrode surface studied by cyclic voltammetry, electrochemical quartz microbalance, and electrochemical atomic force microscopy. Langmuir 29, 2420–2426 (2013)
Utsunomiya, T., Yokota, Y., Enoki, T., Hirao, Y., Kubo, T., Fukui, K.: Voltammetric and in situ frequency modulation atomic force microscopic investigation of phenalenyl derivatives adsorbed on graphite surfaces. Carbon 77, 184–190 (2014)
Hayes, R., Borisenko, N., Tam, M.K., Howlett, P.C., Endres, F., Atkin, R.: Double layer structure of ionic liquids at the Au(111) electrode interface: an atomic force microscopy investigation. J. Phys. Chem. C 115, 6855–6863 (2011)
Hayes, R., Warr, G.G., Atkin, R.: Structure and nanostructure in ionic liquids. Chem. Rev. 115, 6357–6426 (2015)
Fukuma, T., Kobayashi, K., Matsushige, K., Yamada, H.: True atomic resolution in liquid by frequency-modulation atomic force microscopy. Appl. Phys. Lett. 87, 34101 (2005)
Negami, M., Ichii, T., Murase, K., Sugimura, H.: Visualization of ionic-liquid/solid interfaces by frequency modulation atomic force microscopy. ECS Trans. 50, 349–355 (2013)
Utsunomiya, T., Yokota, Y., Enoki, T., Fukui, K.: Potential-dependent hydration structures at aqueous solution/graphite interfaces by electrochemical frequency modulation atomic force microscopy. Chem. Commun. 50, 15537–15540 (2014)
Utsunomiya, T., Tatsumi, S., Yokota, Y., Fukui, K.: Potential-dependent structures investigated at the perchloric acid solution/iodine modified Au(111) interface by electrochemical frequency-modulation atomic force microscopy. Phys. Chem. Chem. Phys. 17, 12616–12622 (2015)
Fukuma, T., Kimura, M., Kobayashi, K., Matsushige, K., Yamada, H.: Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy. Rev. Sci. Instrum. 76, 53704 (2005)
Batina, N., Yamada, T., Itaya, K.: Atomic level characterization of the iodine-modified Au(111) electrode surface in perchloric acid solution by in-situ STM and ex-Situ LEED. Langmuir 11, 4568–4576 (1995)
Asakawa, H., Yoshioka, S., Nishimura, K., Fukuma, T.: Spatial distribution of lipid headgroups and water molecules at membrane/water interfaces visualized by three-dimensional scanning force microscopy. ACS Nano 6, 9013–9020 (2012)
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Utsunomiya, T., Yokota, Y., Fukui, Ki. (2018). Electrochemical Atomic Force Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_13
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DOI: https://doi.org/10.1007/978-981-10-6156-1_13
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