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Physics-of-Failure Approach for Electronics

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Risk-Based Engineering

Part of the book series: Springer Series in Reliability Engineering ((RELIABILITY))

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Abstract

Physics-of-failure (PoF) approach is integral part of IRBE as in this approach reliability of the component and systems is predicted based on scientific models for identification of applicable failure mechanism and evaluation degradation to arrive at time to failure. The traditional statistical approach for reliability evaluation can predict the probability of failure but incapable of providing information on instant of failure. The physics-of-failure approach as part of prognostics framework can predict failure in advance with acceptable level of uncertainty. PoF as an approach is extensively being applied for electronics reliability; hence, this chapter deals with PoF approach to electronics.

Ask the right questions and nature will open the doors to her secrets.

Sir C. V. Raman

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Author information

Authors and Affiliations

  1. Research Reactor Services Division, Homi Bhabha National Institute, Bhabha Atomic Research Centre, Mumbai, India

    Prabhakar V. Varde

  2. Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MA, USA

    Michael G. Pecht

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  1. Prabhakar V. Varde
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  2. Michael G. Pecht
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Correspondence to Prabhakar V. Varde .

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Varde, P.V., Pecht, M.G. (2018). Physics-of-Failure Approach for Electronics. In: Risk-Based Engineering. Springer Series in Reliability Engineering. Springer, Singapore. https://doi.org/10.1007/978-981-13-0090-5_12

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  • DOI: https://doi.org/10.1007/978-981-13-0090-5_12

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-0088-2

  • Online ISBN: 978-981-13-0090-5

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